Invention Grant
US08355135B2 Surface plasmon resonance measuring device, sample cell, and measuring method
有权
表面等离子体共振测量装置，样品池和测量方法
- Patent Title: Surface plasmon resonance measuring device, sample cell, and measuring method
- Patent Title (中): 表面等离子体共振测量装置，样品池和测量方法
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Application No.: US12812219Application Date: 2009-01-16
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Publication No.: US08355135B2Publication Date: 2013-01-15
- Inventor: Yuzuru Iwasaki , Tsutomu Horiuchi , Michiko Seyama , Toru Miura , Tsuneyuki Haga , Tsuyoshi Hayashi
- Applicant: Yuzuru Iwasaki , Tsutomu Horiuchi , Michiko Seyama , Toru Miura , Tsuneyuki Haga , Tsuyoshi Hayashi
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Priority: JP2008-006647 20080116; JP2008-006649 20080116
- International Application: PCT/JP2009/050564 WO 20090116
- International Announcement: WO2009/091039 WO 20090723
- Main IPC: G01N21/55
- IPC: G01N21/55 ; H03M1/22
Abstract:
A surface plasmon resonance measuring device includes a light source (2) which irradiates, with condensed light, a sample cell (10) having the characteristic structure of the reflectance of light that is formed in advance as a code from at least either of a substance film to be measured and a substance film different from the substance film to be measured, from a surface opposite to one on which the substance film to be measured is immobilized to a metal thin film, a CCD camera (5) which detects light reflected by the sample cell (10), and a data processing device (6) which extracts the identification code of the sample cell (10) from the feature of an image sensed by the camera (5).
Public/Granted literature
- US20100284013A1 SURFACE PLASMON RESONANCE MEASURING DEVICE, SAMPLE CELL, AND MEASURING METHOD Public/Granted day:2010-11-11
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