Invention Grant
- Patent Title: Retention voltage generation
- Patent Title (中): 保留电压产生
-
Application No.: US12926650Application Date: 2010-12-01
-
Publication No.: US08355293B2Publication Date: 2013-01-15
- Inventor: Nicolaas Klarinus Johannes van Winkelhoff , Sebastien Nicolas Ricavy
- Applicant: Nicolaas Klarinus Johannes van Winkelhoff , Sebastien Nicolas Ricavy
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Nixon & Vanderhye P.C.
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
An integrated circuit and method includes retention voltage generation circuitry which receives a supply voltage from a supply voltage node and provides a retention voltage. Functional circuitry is connected between the retention voltage node and a reference voltage node and is held in a data retention state when at least a minimum voltage is provided between the retention voltage node and the reference voltage node. Each of the circuits includes at least one p-type threshold device and at least one n-type threshold device, both having a characteristic threshold voltage. The p-type and n-type threshold devices are connected in parallel between the supply voltage node and the retention voltage node. A variation in the characteristic threshold voltage of either of the at least one p-type or the at least one n-type device maintains at least the minimum voltage between the retention voltage node and the reference voltage node.
Public/Granted literature
- US20120140585A1 Retention voltage generation Public/Granted day:2012-06-07
Information query