Invention Grant
- Patent Title: Amplitude probability distribution measurement apparatus
- Patent Title (中): 振幅概率分布测量装置
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Application No.: US12730825Application Date: 2010-03-24
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Publication No.: US08355467B2Publication Date: 2013-01-15
- Inventor: Sunao Ronte , Satoru Arakawa
- Applicant: Sunao Ronte , Satoru Arakawa
- Applicant Address: JP Atsugi-shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-shi
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2009-087584 20090331
- Main IPC: H04L27/00
- IPC: H04L27/00

Abstract:
There is disclosed a general-purpose APD measurement apparatus capable of changing a measurement condition, such as the number of channels or a resolution bandwidth (RBW) in compliance with a standard for the subject of measurement, measuring various subjects of measurement, and correcting measurement equipment, thereby enabling a higher accuracy of measurement. The resolution bandwidth (RBW) or the number of channels when measurement is performed can be flexibly changed by controlling the cycle of a clock signal whose data are sampled by A/D conversion means 110, frequency selection means 130, and an APD unit 300. The frequency selection means 130 includes FFT type processing means 131 and filter bank type processing means 132 arranged in parallel. The output of FFT type processing means 131 is corrected based on the output of the filter bank type processing means 132 with a high accuracy of measurement. Accordingly, a higher accuracy of measurement is made possible.
Public/Granted literature
- US20100246653A1 AMPLITUDE PROBABILITY DISTRIBUTION MEASUREMENT APPARATUS Public/Granted day:2010-09-30
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