Invention Grant
- Patent Title: Corresponding point searching method and three-dimensional position measuring method
- Patent Title (中): 对应点搜索方法和三维位置测量方法
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Application No.: US12513846Application Date: 2007-11-09
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Publication No.: US08355564B2Publication Date: 2013-01-15
- Inventor: Takafumi Aoki , Takuma Shibahara , Hiroshi Nakajima , Koji Kobayashi , Atsushi Katsumata
- Applicant: Takafumi Aoki , Takuma Shibahara , Hiroshi Nakajima , Koji Kobayashi , Atsushi Katsumata
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Azbil Corporation,National University Corporation Tohoku University
- Current Assignee: Azbil Corporation,National University Corporation Tohoku University
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Priority: JP2006-304620 20061109
- International Application: PCT/JP2007/071783 WO 20071109
- International Announcement: WO2008/056765 WO 20080515
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A plurality of images (I, J) of an object (M) when viewed from different viewpoints are taken in. One of the images is set as a standard image (I), and the other image is set as a reference image (J). One-dimensional pixel data strings with a predetermined width (W) are cut out from the standard image (I) and the reference image (J) along epipolar lines (EP1, EP2) calculated from a camera parameter (CPR) and the reference point (p). Calculating a phase-only correlation function from the cut one-dimensional pixel data strings will obtain a correlation peak position (Pa1). A positional shift amount (d) from the correlation peak position (Pa1) is obtained. A search is made for a corresponding point (q) corresponding to the reference point (p) based on this position shift amount (d).
Public/Granted literature
- US20090304266A1 CORRESPONDING POINT SEARCHING METHOD AND THREE-DIMENSIONAL POSITION MEASURING METHOD Public/Granted day:2009-12-10
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