Invention Grant
- Patent Title: Method for detecting high impedance faults by analyzing a local deviation from a regularization
- Patent Title (中): 通过分析局部偏离正则化来检测高阻抗故障的方法
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Application No.: US12028466Application Date: 2008-02-08
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Publication No.: US08355882B2Publication Date: 2013-01-15
- Inventor: Tomasz J. Nowicki , Grzegorz M. Swirszcz
- Applicant: Tomasz J. Nowicki , Grzegorz M. Swirszcz
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: F. Chau & Associates, LLC
- Agent Stephen C. Kaufman
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A method for detecting high impedance faults, including: receiving an input waveform from a circuit; computing a root mean square of the input waveform; fitting a regression line to the root mean squares; computing a deviation between the regression line and the root mean squares; determining whether the deviations are above a threshold; and outputting a value indicating that a fault has occurred in the circuit when the deviation is above the threshold and outputting a value indicating that a fault did not occur in the circuit when the deviation is below the threshold.
Public/Granted literature
- US20090204347A1 METHOD FOR DETECTING HIGH IMPEDANCE FAULTS BY ANALYZING A LOCAL DEVIATION FROM A REGULARIZATION Public/Granted day:2009-08-13
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