Invention Grant
US08356215B2 Testing apparatus and method for analyzing a memory module operating within an application system 有权
用于分析在应用系统内运行的存储器模块的测试装置和方法

Testing apparatus and method for analyzing a memory module operating within an application system
Abstract:
A testing apparatus for analyzing a memory module under test operating within an application system, wherein the memory module under test is coupled to a processor of the application system, is disclosed herein. In at least one embodiment, the testing apparatus comprises a first interface for coupling to the application system, a second interface for coupling to a reference memory module, a controller coupled to the first and second interfaces, at least one comparator, and a data logging unit. The data logging unit is configured to receive logging data from the controller and at least one test result from the at least one comparator, and to record, in a memory, at least a subset of the logging data, such that more specific details of memory errors revealed during behavioral testing of memory modules may be identified, examined, and stored for subsequent analysis.
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