Invention Grant
- Patent Title: Memory coupling scan input to first of scan path segments
- Patent Title (中): 存储器耦合扫描输入到第一个扫描路径段
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Application No.: US13453501Application Date: 2012-04-23
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Publication No.: US08356220B2Publication Date: 2013-01-15
- Inventor: Lee D. Whetsel , Joel J. Graber
- Applicant: Lee D. Whetsel , Joel J. Graber
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
Scan and Scan-BIST architectures are commonly used to test digital circuitry in integrated circuits. The present disclosure improves upon low power Scan and Scan-BIST methods. The improvement allows the low power Scan and Scan-BIST architectures to achieve a delay test capability equally as effective as the delay test capabilities used in conventional scan and Scan-BIST architectures.
Public/Granted literature
- US20120204072A1 LOW POWER SCAN & DELAY TEST METHOD AND APPARATUS Public/Granted day:2012-08-09
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