Invention Grant
- Patent Title: Analyzer
- Patent Title (中): 分析仪
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Application No.: US11547945Application Date: 2005-04-08
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Publication No.: US08357273B2Publication Date: 2013-01-22
- Inventor: Takuji Kawai
- Applicant: Takuji Kawai
- Applicant Address: JP Kyoto
- Assignee: Arkray, Inc.
- Current Assignee: Arkray, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Fox Rothschild LLP
- Priority: JP2004-117123 20040412
- International Application: PCT/JP2005/006918 WO 20050408
- International Announcement: WO2005/100968 WO 20051027
- Main IPC: G01N33/487
- IPC: G01N33/487

Abstract:
The present invention relates to an analyzer (1) to be used with an analytical tool (2) mounted thereto and used for analyzing a particular component contained in a sample supplied to the analytical tool (2). The analyzer (1) includes at least one detection terminal pair (11, 12) including a first and a second detection terminals (11A, 11B, 12A, 12B) which are capable of selecting a mutually contacting state and a non-contacting state, a detector (15) for detecting the state of contact of the first and the second detection terminals (11A, 11B, 12A, 12B), and an abnormality detector (16) for detecting an abnormality of the at least one detection terminal pair (11, 12) based on the detection result by the detector (15).
Public/Granted literature
- US20070229085A1 Analyzer Public/Granted day:2007-10-04
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