Invention Grant
- Patent Title: Materials analysis
- Patent Title (中): 材料分析
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Application No.: US10569321Application Date: 2004-08-16
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Publication No.: US08357340B2Publication Date: 2013-01-22
- Inventor: Ryszard Jurek Kobylecki
- Applicant: Ryszard Jurek Kobylecki
- Applicant Address: GB Cambridgeshire
- Assignee: Wicken Technology Limited
- Current Assignee: Wicken Technology Limited
- Current Assignee Address: GB Cambridgeshire
- Agency: Fay Sharpe LLP
- Priority: GB0319457.8 20030819
- International Application: PCT/GB2004/003538 WO 20040816
- International Announcement: WO2005/019814 WO 20050303
- Main IPC: B01D35/00
- IPC: B01D35/00 ; B01L99/00

Abstract:
A materials analysis device (2) comprises an inner receptacle (4), incorporating a filter (5) at its lower end, within an outer receptacle (6). Gas inlet/outlet ports (8, 10) are arranged to provide a means whereby solvent can be caused to pass between the receptacles (4, 6) via filter (5). Solvent in the receptacles (4, 6) is arranged to be heated and its temperature assessed. In use in one embodiment, a solute material to be analyzed is introduced into outer receptacle (6) and a solvent is introduced into inner receptacle (4). The solvent is caused to pass back and (15) forth between the receptacles (4, 6) via the filter (5) until a saturated solution of the solute is present in inner receptacle (4). This may be removed for analysis. By undertaking the process described at a range of temperatures, a solubility profile for the solute can be determined.
Public/Granted literature
- US20070149022A1 Materials analysis Public/Granted day:2007-06-28
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