Invention Grant
- Patent Title: Method and apparatus for sample extraction and handling
- Patent Title (中): 样品提取和处理方法和设备
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Application No.: US12446376Application Date: 2007-10-20
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Publication No.: US08357913B2Publication Date: 2013-01-22
- Inventor: Enrique Agorio , James Edgar Hudson , Michael Tanguay , Jason Arjavac , Gerhard Daniel
- Applicant: Enrique Agorio , James Edgar Hudson , Michael Tanguay , Jason Arjavac , Gerhard Daniel
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg
- International Application: PCT/US2007/082030 WO 20071020
- International Announcement: WO2008/051880 WO 20080502
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G21K5/08

Abstract:
An improved method and apparatus for extracting and handling samples for STEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.
Public/Granted literature
- US20100305747A1 METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING Public/Granted day:2010-12-02
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