Invention Grant
US08358011B1 Interconnect structures with engineered dielectrics with nanocolumnar porosity
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互连结构与具有纳米柱孔隙度的工程电介质
- Patent Title: Interconnect structures with engineered dielectrics with nanocolumnar porosity
- Patent Title (中): 互连结构与具有纳米柱孔隙度的工程电介质
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Application No.: US11899842Application Date: 2007-09-07
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Publication No.: US08358011B1Publication Date: 2013-01-22
- Inventor: Matthew E. Colburn , Satya V. Nitta , Sampath Purushothaman , Charles Black , Kathryn Guarini
- Applicant: Matthew E. Colburn , Satya V. Nitta , Sampath Purushothaman , Charles Black , Kathryn Guarini
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Thomas A. Beck; Daniel P. Morris
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A method for forming an interconnect structure with nanocolumnar intermetal dielectric is described involving the construction of an interconnect structure using a solid dielectric, and introducing a regular array of vertically aligned nanoscale pores through stencil formation and etching to form a hole array and subsequently pinching off the tops of the hole array with a cap dielectric. Variations of the method and means to construct a multilevel nanocolumnar interconnect structure are also described.
Public/Granted literature
- US20130009315A1 INTERCONNECT STRUCTURES WITH ENGINEERED DIELECTRICS WITH NANOCOLUMNAR POROSITY Public/Granted day:2013-01-10
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