Invention Grant
- Patent Title: Methods and circuits for measuring mutual and self capacitance
- Patent Title (中): 用于测量相互和自身电容的方法和电路
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Application No.: US12395462Application Date: 2009-02-27
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Publication No.: US08358142B2Publication Date: 2013-01-22
- Inventor: Andriy Maharyta
- Applicant: Andriy Maharyta
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01R27/26
- IPC: G01R27/26
Abstract:
A capacitance measurement circuit for measuring self and mutual capacitances may include a first electrode capacitively coupled with a second electrode, a first plurality of switches coupled with the first electrode, and a second plurality of switches coupled with the second electrode, wherein, during a first operation stage, the first plurality of switches is configured to apply a first initial voltage to the first electrode and the second plurality of switches is configured to apply a second initial voltage to the second electrode, and wherein, during a second operation stage, the first plurality of switches is configured to connect the first electrode with a measurement circuit, and the second plurality of switches is configured to connect the second electrode with a constant voltage.
Public/Granted literature
- US20120043971A1 METHODS AND CIRCUITS FOR MEASURING MUTUAL AND SELF CAPACITANCE Public/Granted day:2012-02-23
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