Invention Grant
US08358339B2 Testing method, testing and processing system, processing device, testing device, manufacturing/testing device, and manufacturing/testing method
失效
测试方法,测试和处理系统,处理设备,测试设备,制造/测试设备,以及制造/测试方法
- Patent Title: Testing method, testing and processing system, processing device, testing device, manufacturing/testing device, and manufacturing/testing method
- Patent Title (中): 测试方法,测试和处理系统,处理设备,测试设备,制造/测试设备,以及制造/测试方法
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Application No.: US12373350Application Date: 2007-07-25
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Publication No.: US08358339B2Publication Date: 2013-01-22
- Inventor: Kenta Hayashi
- Applicant: Kenta Hayashi
- Applicant Address: JP Tokyo
- Assignee: Dai Nippon Printing Co., Ltd
- Current Assignee: Dai Nippon Printing Co., Ltd
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2006-205080 20060727; JP2006-206968 20060728; JP2006-208778 20060731
- International Application: PCT/JP2007/064549 WO 20070725
- International Announcement: WO2008/013188 WO 20080131
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N9/47

Abstract:
An inspecting method for grasping the inspection result on an intermediate (or an n-th) treatment without long extension of time, in case predetermined treatments of a predetermined number (N times) are exerted on a plurality of sheets running on a conveyor line, before all the treatments of N-times are ended. The inspecting method for inspecting an object subjected to the predetermined treatment includes performing the predetermined treatment repeatedly by the N-times (N: a natural number of 2 or more) sequentially on the individual objects being conveyed on the conveyor line, and an inspecting step of testing such a leading one of the objects as has been subjected to the n-th (n: a natural number of 1 or more but N or less) treatment, and returning the tested object to after such one of the targets as was subjected to the n-th treatment.
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