Invention Grant
US08358682B2 Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method 失效
信号处理装置,测试系统,失真检测装置,信号补偿装置,分析信号生成装置,记录介质和分析信号生成方法

  • Patent Title: Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method
  • Patent Title (中): 信号处理装置,测试系统,失真检测装置,信号补偿装置,分析信号生成装置,记录介质和分析信号生成方法
  • Application No.: US12580105
    Application Date: 2009-10-15
  • Publication No.: US08358682B2
    Publication Date: 2013-01-22
  • Inventor: Koji Asami
  • Applicant: Koji Asami
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2008-267912 20081016; JP2009-023926 20090204
  • Main IPC: H04B17/00
  • IPC: H04B17/00
Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method
Abstract:
Provided is a reference data converting section that rearranges each of a plurality of frequency components along the frequency axis such that (i) a fundamental wave component and harmonic wave components of a reference digital signal are within a first Nyquist region of a spectrum of the reference digital signal and (ii) image components of the fundamental wave component and the harmonic wave components are within a second Nyquist region of the spectrum; and a distortion detecting section that detects the non-linear distortion of the reference digital signal caused by each harmonic wave component, based on each harmonic wave component having a prescribed order number in the spectrum in which each frequency component has been rearranged by the reference data converting section.
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