Invention Grant
- Patent Title: Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method
- Patent Title (中): 信号处理装置,测试系统,失真检测装置,信号补偿装置,分析信号生成装置,记录介质和分析信号生成方法
-
Application No.: US12580105Application Date: 2009-10-15
-
Publication No.: US08358682B2Publication Date: 2013-01-22
- Inventor: Koji Asami
- Applicant: Koji Asami
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2008-267912 20081016; JP2009-023926 20090204
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
Provided is a reference data converting section that rearranges each of a plurality of frequency components along the frequency axis such that (i) a fundamental wave component and harmonic wave components of a reference digital signal are within a first Nyquist region of a spectrum of the reference digital signal and (ii) image components of the fundamental wave component and the harmonic wave components are within a second Nyquist region of the spectrum; and a distortion detecting section that detects the non-linear distortion of the reference digital signal caused by each harmonic wave component, based on each harmonic wave component having a prescribed order number in the spectrum in which each frequency component has been rearranged by the reference data converting section.
Public/Granted literature
Information query