Invention Grant
US08358736B2 Apparatus, method and computer-readable medium analyzing components using X-ray
有权
使用X射线分析组件的装置,方法和计算机可读介质
- Patent Title: Apparatus, method and computer-readable medium analyzing components using X-ray
- Patent Title (中): 使用X射线分析组件的装置,方法和计算机可读介质
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Application No.: US12926363Application Date: 2010-11-12
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Publication No.: US08358736B2Publication Date: 2013-01-22
- Inventor: Seok Min Han , Young Hun Sung , Jong Ha Lee , Sung Su Kim , Dong-Goo Kang , Kwang Eun Jang
- Applicant: Seok Min Han , Young Hun Sung , Jong Ha Lee , Sung Su Kim , Dong-Goo Kang , Kwang Eun Jang
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Staas & Halsey LLP
- Priority: KR10-2009-0109001 20091112
- Main IPC: G01N23/06
- IPC: G01N23/06

Abstract:
Provided is an apparatus, method and computer-readable medium analyzing components using an X-ray. The apparatus, method and computer-readable medium may photograph an object using an X-ray of at least two energy bands to output X-ray images, predict a component ratio of the object using the X-ray images, calculate a length of the object for each of the at least two energy bands using an intensity of the X-ray images, when the object is configured in the predicted component ratio, and verify whether an error in the component ratio occurs by comparing the lengths of the object calculated for each of the at least two energy bands.
Public/Granted literature
- US20110110489A1 Apparatus, method and computer-readable medium analyzing components using X-ray Public/Granted day:2011-05-12
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