Testing a circuit in a post-silicon stage is performed by enabling the different processing entities of the circuit to determine a consistent access permissions schema in a random manner. Based upon the consistent access permissions schema, addresses to be accessed during the testing of the circuit may be determined. The addresses may be determined in a random manner. The consistent permissions schema may be determined based on a template representative of repetitive portions of access permissions schema. The disclosed subject matter may utilize biasing modules to bias the test generation to provide a test having a predetermined characteristic. The disclosed subject matter may utilize a joint random seed or other techniques to provide for consistent random decisions by the different processing entities.