Invention Grant
- Patent Title: Verification of 3D integrated circuits
- Patent Title (中): 3D集成电路验证
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Application No.: US13274091Application Date: 2011-10-14
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Publication No.: US08359554B2Publication Date: 2013-01-22
- Inventor: Chung-Hsing Wang , Chih Sheng Tsai , Ying-Lin Liu , Kai-Yun Lin
- Applicant: Chung-Hsing Wang , Chih Sheng Tsai , Ying-Lin Liu , Kai-Yun Lin
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of designing and verifying 3D integrated circuits (3D IC) including providing a first layout corresponding to a first device of a 3D IC. The first layout includes a first interface layer. A second layout corresponding to a second device of the 3D IC is also provided. The second layout includes a second interface layer. A verification of the 3D is performed by verifying the first and second interface layers. The verification includes performing at least one of a design rule check (DRC) or a layout-versus-schematic (LVS) on the first and/or second interface layers.
Public/Granted literature
- US20120036489A1 DESIGN AND VERIFICATION OF 3D INTEGRATED CIRCUITS Public/Granted day:2012-02-09
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