Invention Grant
- Patent Title: Automatic collection of diagnostic traces in an automation framework
- Patent Title (中): 在自动化框架中自动收集诊断轨迹
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Application No.: US12331883Application Date: 2008-12-10
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Publication No.: US08359581B2Publication Date: 2013-01-22
- Inventor: Christopher N. Ortiz
- Applicant: Christopher N. Ortiz
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Dennis Jung
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00

Abstract:
A method for software test automation includes receiving system software in a test server; receiving test software and in a test server; configuring test environment resources for the test software; executing an automated test of the test software comprising: performing unit test of the test software; comparing anticipated performance results of the test software with actual results of the test software; determining whether there are differences in the anticipated performance and the actual performance; wherein in the event there are differences in the anticipated performance and the actual performance: applying trace settings; deleting runtime logs associated with the unit test; re-executing the unit test; storing trace data associated with the re-executed unit test; notifying a user of the re-executed unit test; providing the user with the stored trace data; and cleaning up the test environment resources.
Public/Granted literature
- US20100146489A1 AUTOMATIC COLLECTION OF DIAGNOSTIC TRACES IN AN AUTOMATION FRAMEWORK Public/Granted day:2010-06-10
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