Invention Grant
- Patent Title: Photon transfer curve test time reduction
- Patent Title (中): 光子转移曲线测试时间缩短
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Application No.: US11784075Application Date: 2007-04-05
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Publication No.: US08363042B2Publication Date: 2013-01-29
- Inventor: Mark Nussbächer , Giuseppe D'onofrio
- Applicant: Mark Nussbächer , Giuseppe D'onofrio
- Applicant Address: DE Kirchheim/Teck-Nabern
- Assignee: Digital Imaging Systems GmbH
- Current Assignee: Digital Imaging Systems GmbH
- Current Assignee Address: DE Kirchheim/Teck-Nabern
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Priority: EP07392002 20070328
- Main IPC: G06F3/038
- IPC: G06F3/038

Abstract:
An improved method for photon transfer curve (PTC) testing in an image sensor is described. A cost and time savings is achieved by reducing the number of frames necessary for measurements to two that are generated by illuminating a first plurality of pixel rows at a first intensity level m1, a second plurality of pixel rows at a second intensity level t2, and so forth up to an nth plurality of pixel rows illuminated at an nth intensity level mn where mn>m2>m1. The resulting image has “n” regions each with a different brightness. The highest intensity level essentially saturates the pixels in the nth region. In one example, a four row exposure and five intensity levels are employed in the illuminator sequence. An intelligent light source is pre-programmable with illumination intensity settings and is synchronized to the image sensor using HSYNC and VSYNC signals, for example.
Public/Granted literature
- US20080243419A1 Photon transfer curve test time reduction Public/Granted day:2008-10-02
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