Invention Grant
- Patent Title: Surface inspection apparatus
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Application No.: US13269268Application Date: 2011-10-07
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Publication No.: US08363214B2Publication Date: 2013-01-29
- Inventor: Takashi Watanabe
- Applicant: Takashi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-184155 20060704
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A surface inspection apparatus for observing an edge portion of an object to be inspected includes an illumination device that irradiates an illumination light to the edge portion; and an observation device that forms an image of an observation region of the edge portion illuminated with the illumination light. The illumination device emits a first irradiation beam and a second irradiation beam as the illumination light. The first irradiation beam is incident at approximately right angles to the edge portion for compensating brightness of the image and the second irradiation beam is obliquely incident laterally to the observation region of the edge portion for generating a shadow depending on a surface state of the observation region.
Public/Granted literature
- US20120026490A1 SURFACE INSPECTION APPARATUS Public/Granted day:2012-02-02
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