Invention Grant
- Patent Title: Spectrometric measurement apparatus, image evaluation apparatus, and image forming apparatus
- Patent Title (中): 光谱测量装置,图像评估装置和图像形成装置
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Application No.: US12901280Application Date: 2010-10-08
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Publication No.: US08363217B2Publication Date: 2013-01-29
- Inventor: Manabu Seo , Naohiro Kamijo , Kohei Shimbo
- Applicant: Manabu Seo , Naohiro Kamijo , Kohei Shimbo
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2009-253498 20091104
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
A spectrometric measurement apparatus includes a light radiation unit for radiating light onto a medium; a hole array including openings arranged one-dimensionally for transmitting diffusion light from the medium; an imaging optical system configured to focus an image from the hole array; a diffraction element configured to diffract the light for focusing the image; and a light receiving unit including pixels arranged one-dimensionally configured to receive the light that has been dispersed by the diffraction element and spectrometric sensors each corresponding to a predetermined number of the pixels. The light transmitted through each of the openings of the hole array is dispersed by the diffraction element, and then the light enters the pixels so that spectral properties of the diffusion light are acquired. The structure of the diffraction element includes variations that are formed in accordance with the height of the image that is focused by the imaging optical system.
Public/Granted literature
- US20110106472A1 SPECTROMETRIC MEASUREMENT APPARATUS, IMAGE EVALUATION APPARATUS, AND IMAGE FORMING APPARATUS Public/Granted day:2011-05-05
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