Invention Grant
US08363475B2 Non-volatile memory unit cell with improved sensing margin and reliability
有权
非易失性存储单元,具有改进的感测裕度和可靠性
- Patent Title: Non-volatile memory unit cell with improved sensing margin and reliability
- Patent Title (中): 非易失性存储单元,具有改进的感测裕度和可靠性
-
Application No.: US12750650Application Date: 2010-03-30
-
Publication No.: US08363475B2Publication Date: 2013-01-29
- Inventor: Hsin-Ming Chen , Shih-Chen Wang , Wen-Hao Ching , Yen-Hsin Lai , Hau-Yan Lu , Ching-Sung Yang
- Applicant: Hsin-Ming Chen , Shih-Chen Wang , Wen-Hao Ching , Yen-Hsin Lai , Hau-Yan Lu , Ching-Sung Yang
- Applicant Address: TW Hsinchu
- Assignee: eMemory Technology Inc.
- Current Assignee: eMemory Technology Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A non-volatile memory unit cell includes a first transistor pair and first and second control gates. The first transistor pair includes first and second transistors that are connected in series and of the same type. The first and second transistors have a first floating polysilicon gate and a second floating polysilicon gate, respectively. The first control gate is coupled to the first floating polysilicon gate through a tunneling junction and the second control gate is coupled to the second floating polysilicon gate through another tunneling junction.
Public/Granted literature
- US20110242893A1 NON-VOLATILE MEMORY UNIT CELL WITH IMPROVED SENSING MARGIN AND RELIABILITY Public/Granted day:2011-10-06
Information query