Invention Grant
US08363475B2 Non-volatile memory unit cell with improved sensing margin and reliability 有权
非易失性存储单元,具有改进的感测裕度和可靠性

Non-volatile memory unit cell with improved sensing margin and reliability
Abstract:
A non-volatile memory unit cell includes a first transistor pair and first and second control gates. The first transistor pair includes first and second transistors that are connected in series and of the same type. The first and second transistors have a first floating polysilicon gate and a second floating polysilicon gate, respectively. The first control gate is coupled to the first floating polysilicon gate through a tunneling junction and the second control gate is coupled to the second floating polysilicon gate through another tunneling junction.
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