Invention Grant
- Patent Title: Test circuit for serial link receiver
- Patent Title (中): 串行链路接收机测试电路
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Application No.: US13044604Application Date: 2011-03-10
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Publication No.: US08363736B2Publication Date: 2013-01-29
- Inventor: Hayden C. Cranford , Daniel P. Greenberg , Joseph M. Stevens , Westerfield J. Ficken
- Applicant: Hayden C. Cranford , Daniel P. Greenberg , Joseph M. Stevens , Westerfield J. Ficken
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ian MacKinnon
- Main IPC: H04L25/00
- IPC: H04L25/00 ; H04B17/00

Abstract:
A test circuit for a serial link receiver includes a first current source coupled to a first input of the serial link receiver, and a second current source coupled to a second input of the serial link receiver. The first current source is symmetrically matched to the second current source. A first switch of the first current source is turned on to permit a charge-retaining mechanism thereof to be charged. A second switch of the first current source is turned on to permit the retained charge retained to be asserted on the first input. The charge turns on a control switch of the first current source, through which the charge is asserted on the first input. A charge-draining mechanism of the first current source is turned on to thereafter permit the charge to be drained in a controlled manner after the charge has been asserted.
Public/Granted literature
- US20110156663A1 TEST CIRCUIT FOR SERIAL LINK RECEIVER Public/Granted day:2011-06-30
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