Invention Grant
- Patent Title: Offset amount calibrating method and surface texture measuring machine
- Patent Title (中): 偏移量校准方法和表面纹理测量机
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Application No.: US12900834Application Date: 2010-10-08
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Publication No.: US08363904B2Publication Date: 2013-01-29
- Inventor: Tomotaka Takahashi
- Applicant: Tomotaka Takahashi
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2009-236126 20091013
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/24

Abstract:
An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.
Public/Granted literature
- US20110085178A1 OFFSET AMOUNT CALIBRATING METHOD AND SURFACE TEXTURE MEASURING MACHINE Public/Granted day:2011-04-14
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