Invention Grant
- Patent Title: Marker identification and processing in x-ray images
- Patent Title (中): x射线图像中的标记识别和处理
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Application No.: US12626197Application Date: 2009-11-25
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Publication No.: US08363919B2Publication Date: 2013-01-29
- Inventor: David Sebok
- Applicant: David Sebok
- Applicant Address: US PA Hatfield
- Assignee: Imaging Sciences International LLC
- Current Assignee: Imaging Sciences International LLC
- Current Assignee Address: US PA Hatfield
- Agency: Michael Best & Friedrich LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/40 ; A61B6/00

Abstract:
A mechanism for rapidly detecting and localizing external markers placed on a patient in projection images. Embodiments of the invention allow the markers to be detected even in the presence of dense surrounding anatomy and extensive patient motion. Once the positions of the marker points on the projection images are extracted, the marker points can be used to perform marker-based patient motion detection. Embodiments of the invention can also be used outside of motion correction, such as for scanner calibration, automatic cephalometric measurements, and quality control assessment.
Public/Granted literature
- US20110123084A1 MARKER IDENTIFICATION AND PROCESSING IN X-RAY IMAGES Public/Granted day:2011-05-26
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