Invention Grant
- Patent Title: Shape measurement apparatus and calibration method
- Patent Title (中): 形状测量装置和校准方法
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Application No.: US13088704Application Date: 2011-04-18
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Publication No.: US08363929B2Publication Date: 2013-01-29
- Inventor: Takeshi Kojima , Daisuke Mitsumoto , Yasuhiro Ohnishi , Tuo Zhuang , Yasumoto Mori
- Applicant: Takeshi Kojima , Daisuke Mitsumoto , Yasuhiro Ohnishi , Tuo Zhuang , Yasumoto Mori
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Greenblum & Bernstein P.L.C.
- Priority: JP2010-100994 20100426
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46

Abstract:
The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.
Public/Granted literature
- US20110262007A1 SHAPE MEASUREMENT APPARATUS AND CALIBRATION METHOD Public/Granted day:2011-10-27
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