Invention Grant
- Patent Title: System and method for precision phase shift measurement
- Patent Title (中): 用于精密相移测量的系统和方法
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Application No.: US12434419Application Date: 2009-05-01
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Publication No.: US08364430B2Publication Date: 2013-01-29
- Inventor: Paul L. Kebabian
- Applicant: Paul L. Kebabian
- Applicant Address: US MA Billerica
- Assignee: Aerodyne Research, Inc.
- Current Assignee: Aerodyne Research, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Cesari and McKenna, LLP
- Main IPC: G01R25/00
- IPC: G01R25/00

Abstract:
In one embodiment, a frequency generator produces an excitation signal, a local oscillator signal, and a reference signal at a difference frequency of the excitation signal and local oscillator signal. The excitation signal is applied to a physical system to produce a response signal, which is mixed with the local oscillator signal. A filter selects a difference frequency component. The frequencies of the excitation signal and/or local oscillator signal are varied, such that the magnitude of the difference frequency is constant, but a sign of the difference frequency changes from positive to negative. The phase shift of the difference frequency component, with respect to the reference signal, at each of the two signs of the difference frequency, is measured. The measured phase shift at the negative sign is subtracted from the measured phase shift at the positive sign, and the difference is divided in half, to produce a result.
Public/Granted literature
- US20100057390A1 SYSTEM AND METHOD FOR PRECISION PHASE SHIFT MEASUREMENT Public/Granted day:2010-03-04
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