Invention Grant
- Patent Title: Apparatus, methods, and system of NAND defect management
- Patent Title (中): NAND缺陷管理的设备,方法和系统
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Application No.: US13194212Application Date: 2011-07-29
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Publication No.: US08365028B2Publication Date: 2013-01-29
- Inventor: Michael Murray
- Applicant: Michael Murray
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/00

Abstract:
Various embodiments comprise apparatus, methods, and systems including method comprising searching for a group address among a plurality of group addresses in a mapping table, and if a match is found, performing a memory operation on a first plurality of memory blocks indicated by the mapping table, and if a match is not found, performing a memory operation on a second plurality of memory blocks, the second plurality of memory blocks having the group address.
Public/Granted literature
- US20110296261A1 APPARATUS, METHODS, AND SYSTEM OF NAND DEFECT MANAGEMENT Public/Granted day:2011-12-01
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