Digital circuits and methods for testing a digital circuit are disclosed. One embodiment provides a digital circuit having a first plurality of storage elements, and a second plurality of storage elements. The digital circuit is operable in a first operation mode and in a second operation mode. In the first operation mode, the storage elements of the first plurality of storage elements operate according to their intended use within the digital circuit and the storage elements of the second plurality of storage elements are connected in series. In the second operation mode, the first plurality of storage elements is connected to the second plurality of storage elements to allow data exchange between the first plurality of storage elements and the second plurality of storage elements.