Invention Grant
- Patent Title: Measuring probe for a measuring device
- Patent Title (中): 用于测量装置的测量头
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Application No.: US12312433Application Date: 2007-10-15
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Publication No.: US08365592B2Publication Date: 2013-02-05
- Inventor: Dirk Osswald
- Applicant: Dirk Osswald
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE102006053399 20061110
- International Application: PCT/EP2007/060964 WO 20071015
- International Announcement: WO2008/055758 WO 20080515
- Main IPC: G01F23/00
- IPC: G01F23/00

Abstract:
A measuring probe for a measuring device for ascertaining and monitoring fill level of a medium in a container. The measuring probe includes: a probe holding element, which is mounted on the container; and a probe element, which is secured in an axial bore of the probe holding element by means of a releasable securement structure. A first cavity is provided in the axial bore of the probe holding element and a second cavity on the probe element, and a locking element is provided, which, in a final position of the mounting of the probe element in the probe holding element, protrudes into the first cavity and into the oppositely lying second cavity on the probe element and, thus, forms an axial locking.
Public/Granted literature
- US20100126288A1 MEASURING PROBE FOR A MEASURING DEVICE Public/Granted day:2010-05-27
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