Invention Grant
- Patent Title: Particulate matter detection device
- Patent Title (中): 颗粒物检测装置
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Application No.: US12715598Application Date: 2010-03-02
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Publication No.: US08366813B2Publication Date: 2013-02-05
- Inventor: Masahiro Tokuda , Atsuo Kondo , Takeshi Sakuma , Takashi Egami
- Applicant: Masahiro Tokuda , Atsuo Kondo , Takeshi Sakuma , Takashi Egami
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2009-058845 20090312
- Main IPC: B03C3/47
- IPC: B03C3/47

Abstract:
A particulate matter detection device (100) includes a first electrode (10) that includes a conductive section (12) and a dielectric (14) that covers the conductive section (12), and a second electrode (20) that is disposed opposite to the first electrode (10) at an interval of 0.3 to 3.0 mm. Charged particulate matter contained in a fluid that passes through the space between the first electrode (10) and the second electrode (20), or particulate matter that is contained in a fluid and charged by a discharge that occurs due to application of a voltage between the electrodes (10) and (20) is electrically adsorbed on at least one of the electrodes (10) and (20), and the particulate matter adsorbed on the electrodes (10) and (20) is detected by measuring a change in electrical properties of the first electrode (10), or a change in electrical properties of the electrodes (10) and (20).
Public/Granted literature
- US20100229724A1 PARTICULATE MATTER DETECTION DEVICE Public/Granted day:2010-09-16
Information query
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