Invention Grant
- Patent Title: Sample analyzer and sample analyzing method
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Application No.: US12284271Application Date: 2008-09-19
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Publication No.: US08366998B2Publication Date: 2013-02-05
- Inventor: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant Address: JP
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-243692 20070920
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N35/00

Abstract:
A sample analyzer includes an order receiver for receiving an analyzing order of a sample having analyzing item information; an analyzing section for analyzing a sample according to the analyzing order received by the order receiver; a calculator for counting a first number of analyses by the analyzing section in a first counting period, and a second number of analyses by the analyzing section in a second counting period different from the first counting period; a selection receiver for receiving a selection of either one of the first counting period and the second counting period; an output section; and an output controller for outputting a number of analyses in the counting period received by the selection receiver to the output section based on the counted result by the calculator is disclosed. A sample analyzing method is also disclosed.
Public/Granted literature
- US20090215184A1 Sample analyzer and sample analyzing method Public/Granted day:2009-08-27
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