Invention Grant
US08367467B2 Semiconductor method of forming bump on substrate to prevent ELK ILD delamination during reflow process 有权
在衬底上形成凸块的半导体方法,以防止回流过程中的ELK ILD分层

Semiconductor method of forming bump on substrate to prevent ELK ILD delamination during reflow process
Abstract:
A method of making a semiconductor device that has a flipchip semiconductor die and substrate. A first insulating layer is formed over the substrate. A via is formed through the first insulating layer. Conductive material is deposited in the via to form a conductive pillar or stacked stud bumps. The conductive pillar is electrically connected to a conductive layer within the substrate. A second insulating layer is formed over the first insulating layer. Bump material is formed over the conductive pillar. The bump material is reflowed to form a bump. The first and second insulating layers are removed. The semiconductor die is mounted to the substrate by reflowing the bump to a conductive layer of the die. The semiconductor die also has a third insulating layer formed over the conductive layer and an active surface of the die and UBM formed over the first conductive layer and third insulating layer.
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