Invention Grant
US08367467B2 Semiconductor method of forming bump on substrate to prevent ELK ILD delamination during reflow process
有权
在衬底上形成凸块的半导体方法,以防止回流过程中的ELK ILD分层
- Patent Title: Semiconductor method of forming bump on substrate to prevent ELK ILD delamination during reflow process
- Patent Title (中): 在衬底上形成凸块的半导体方法,以防止回流过程中的ELK ILD分层
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Application No.: US12764805Application Date: 2010-04-21
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Publication No.: US08367467B2Publication Date: 2013-02-05
- Inventor: KiYoun Jang , DaeSik Choi , OhHan Kim , DongSoo Moon
- Applicant: KiYoun Jang , DaeSik Choi , OhHan Kim , DongSoo Moon
- Applicant Address: SG Singapore
- Assignee: STATS ChipPAC, Ltd.
- Current Assignee: STATS ChipPAC, Ltd.
- Current Assignee Address: SG Singapore
- Agency: Patent Law Group: Atkins & Associates, P.C.
- Agent Robert D. Atkins
- Main IPC: H01L21/60
- IPC: H01L21/60

Abstract:
A method of making a semiconductor device that has a flipchip semiconductor die and substrate. A first insulating layer is formed over the substrate. A via is formed through the first insulating layer. Conductive material is deposited in the via to form a conductive pillar or stacked stud bumps. The conductive pillar is electrically connected to a conductive layer within the substrate. A second insulating layer is formed over the first insulating layer. Bump material is formed over the conductive pillar. The bump material is reflowed to form a bump. The first and second insulating layers are removed. The semiconductor die is mounted to the substrate by reflowing the bump to a conductive layer of the die. The semiconductor die also has a third insulating layer formed over the conductive layer and an active surface of the die and UBM formed over the first conductive layer and third insulating layer.
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