Invention Grant
- Patent Title: Chip-scale semiconductor die packaging method
- Patent Title (中): 芯片级半导体芯片封装方法
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Application No.: US13347543Application Date: 2012-01-10
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Publication No.: US08367469B2Publication Date: 2013-02-05
- Inventor: Andrew J. Bonthron , Darren Jay Walworth
- Applicant: Andrew J. Bonthron , Darren Jay Walworth
- Applicant Address: US CA Camarillo
- Assignee: Semtech Corporation
- Current Assignee: Semtech Corporation
- Current Assignee Address: US CA Camarillo
- Agency: McDermott Will & Emery LLP
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method of packaging one or more semiconductor dies is provided. The method includes: providing a first die having a circuit surface and a connecting surface; providing a chip-scale frame having an inside surface and an outside surface, the chip-scale frame having a well region having an opening in the inside surface; coupling the first die to a wall of the well region using a first coupling mechanism for electrical and mechanical coupling; providing a substrate having a top surface and a bottom surface; coupling the inside surface of the chip-scale frame with the top surface of the substrate by a second coupling mechanism, wherein a gap is provided between the circuit surface of the first die and the top surface of the substrate; coupling a heat sink to the outside surface of the chip-scale frame using a third coupling mechanism.
Public/Granted literature
- US20120115279A1 CHIP-SCALE SEMICONDUCTOR DIE PACKAGING METHOD Public/Granted day:2012-05-10
Information query
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