Invention Grant
- Patent Title: Method of fabricating polycrystalline silicon thin film
- Patent Title (中): 制造多晶硅薄膜的方法
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Application No.: US13301368Application Date: 2011-11-21
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Publication No.: US08367527B2Publication Date: 2013-02-05
- Inventor: Won Tae Lee , Han Sick Cho , Hyung Su Kim
- Applicant: Won Tae Lee , Han Sick Cho , Hyung Su Kim
- Applicant Address: KR
- Assignee: Nokord Co., Ltd.
- Current Assignee: Nokord Co., Ltd.
- Current Assignee Address: KR
- Agency: St. Onge Steward Johnston & Reens LLC
- Priority: KR10-2009-0045191 20090522
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L21/36 ; C23C16/24

Abstract:
A method of fabricating a polycrystalline silicon thin that includes a metal layer forming operation of forming a metal layer on an insulating substrate, a first silicon layer forming operation of stacking a silicon layer on the metal layer formed in the metal layer forming operation, a first annealing operation of forming a silicide layer using by moving catalyst metal atoms from the metal layer to the silicon layer using an annealing process, a second silicon layer forming operation of stacking an amorphous silicon layer on the silicide layer, and a crystallization operation of crystallizing the amorphous silicon layer into crystalline silicon through the medium of particles of the silicide layer.
Public/Granted literature
- US20120064702A1 METHOD OF FABRICATING POLYCRYSTALLINE SILICON THIN FILM Public/Granted day:2012-03-15
Information query
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