Invention Grant
- Patent Title: Measurement method, sensor arrangement and measurement system
- Patent Title (中): 测量方法,传感器布置和测量系统
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Application No.: US12668004Application Date: 2008-06-18
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Publication No.: US08368393B2Publication Date: 2013-02-05
- Inventor: Hubert Zangl , Thomas Bretterklieber , Gerald Steiner , Markus Brandner
- Applicant: Hubert Zangl , Thomas Bretterklieber , Gerald Steiner , Markus Brandner
- Applicant Address: AT Unterpremastaetten
- Assignee: Austriamicrosystems AG
- Current Assignee: Austriamicrosystems AG
- Current Assignee Address: AT Unterpremastaetten
- Agency: Cozen O'Connor
- Priority: DE102007031511 20070706; DE102007036984 20070806
- International Application: PCT/EP2008/057704 WO 20080618
- International Announcement: WO2009/007210 WO 20090115
- Main IPC: G01B7/30
- IPC: G01B7/30

Abstract:
In a measurement method, an array of magnetic field sensors (MS0-MS15) is provided, each emitting a sensor signal as a function of magnetic field intensity. A rotational value of a sector-wise magnetized magnetic source that is arranged movably with respect to the array is ascertained as a function of the emitted sensor signals. A set of sensor values is derived from the sensor signals. As a function of the ascertained rotational value, a number of sets of reference values is ascertained that corresponds to a number of predetermined positions of the magnetic source (MAG). The set of sensor values and the number of sets of reference values are compared to one another, and a position is selected from the number of predetermined positions as a function of the comparison.
Public/Granted literature
- US20110025313A1 Measurement Method, Sensor Arrangement and Measurement System Public/Granted day:2011-02-03
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