Invention Grant
- Patent Title: Techniques for correcting measurement artifacts in magnetic resonance thermometry
- Patent Title (中): 在磁共振测温中校正测量伪像的技术
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Application No.: US12615780Application Date: 2009-11-10
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Publication No.: US08368401B2Publication Date: 2013-02-05
- Inventor: Yoav Levy , Arik Hananel , David Freundlich , Gilad Halevy , Benny Assif , Hadas Ziso
- Applicant: Yoav Levy , Arik Hananel , David Freundlich , Gilad Halevy , Benny Assif , Hadas Ziso
- Applicant Address: IL Tirat Carmel
- Assignee: Insightec Ltd.
- Current Assignee: Insightec Ltd.
- Current Assignee Address: IL Tirat Carmel
- Agency: Bingham McCutchen LLP
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
Techniques for correcting measurement artifacts in MR thermometry predict or anticipate movements of objects in or near an MR imaging region that may potentially affect a phase background and then acquire a library of reference phase images corresponding to different phase backgrounds that result from the predicted movements. For each phase image subsequently acquired, one reference phase image is selected from the library of reference phase images to serve as the baseline image for temperature measurement purposes. To avoid measurement artifacts that arise from phase wrapping, the phase shift associated with each phase image is calculated incrementally, that is, by accumulating phase increments from each pair of consecutively scanned phase images.
Public/Granted literature
- US20110109309A1 TECHNIQUES FOR CORRECTING MEASUREMENT ARTIFACTS IN MAGNETIC RESONANCE THERMOMETRY Public/Granted day:2011-05-12
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