Invention Grant
- Patent Title: Capacitance measurement system and method
- Patent Title (中): 电容测量系统及方法
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Application No.: US13151712Application Date: 2011-06-02
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Publication No.: US08368409B2Publication Date: 2013-02-05
- Inventor: Michael Mueck , Ronald F. Cormier, Jr.
- Applicant: Michael Mueck , Ronald F. Cormier, Jr.
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Alan A. R. Cooper; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A capacitance measurement system precharges first terminals (21-0 . . . 21-k . . . 21-n) of a plurality of capacitors (25-0 . . . 25-k . . . 25), respectively, of a CDAC (capacitor digital-to-analog converter) (23) included in a SAR (successive approximation register) converter (17) to a first voltage (VDD) and pre-charges a first terminal (3-j) of a capacitor (CSENj) to a second voltage (GND). The first terminals are coupled to the first terminal of the capacitor to redistribute charges therebetween so as to generate a first voltage on the first terminals and the first terminal of the capacitor, the first voltage being representative of a capacitance of the first capacitor (CSENj). A SAR converter converts the first voltage to a digital representation (DATA) of the capacitor. The capacitance can be a touch screen capacitance.
Public/Granted literature
- US20110234534A1 CAPACITANCE MEASUREMENT SYSTEM AND METHOD Public/Granted day:2011-09-29
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