Invention Grant
- Patent Title: Multi-position probe circuit tester
- Patent Title (中): 多位置探头电路测试仪
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Application No.: US12389682Application Date: 2009-02-20
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Publication No.: US08368415B2Publication Date: 2013-02-05
- Inventor: Thomas J. Jaite , Alexander Shaland , Christopher D. Labedz
- Applicant: Thomas J. Jaite , Alexander Shaland , Christopher D. Labedz
- Applicant Address: US NC Charlotte
- Assignee: SPX Corporation
- Current Assignee: SPX Corporation
- Current Assignee Address: US NC Charlotte
- Agency: Baker & Hostetler LLP
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/20

Abstract:
A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed.
Public/Granted literature
- US20100213961A1 Multi-Position Probe Circuit Tester Public/Granted day:2010-08-26
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