Invention Grant
US08368415B2 Multi-position probe circuit tester 有权
多位置探头电路测试仪

Multi-position probe circuit tester
Abstract:
A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed.
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