Invention Grant
US08368431B2 Pulse edge selection circuit, and pulse generation circuit, sample-hold circuit, and solid-state image sensor using the same 有权
脉冲沿选择电路,脉冲发生电路,采样保持电路和使用该电路的固态图像传感器

  • Patent Title: Pulse edge selection circuit, and pulse generation circuit, sample-hold circuit, and solid-state image sensor using the same
  • Patent Title (中): 脉冲沿选择电路,脉冲发生电路,采样保持电路和使用该电路的固态图像传感器
  • Application No.: US12957187
    Application Date: 2010-11-30
  • Publication No.: US08368431B2
    Publication Date: 2013-02-05
  • Inventor: Masaaki Iwane
  • Applicant: Masaaki Iwane
  • Applicant Address: JP Tokyo
  • Assignee: Canon Kabushiki Kaisha
  • Current Assignee: Canon Kabushiki Kaisha
  • Current Assignee Address: JP Tokyo
  • Agency: Fitzpatrick, Cella, Harper & Scinto
  • Priority: JP2009-298821 20091228
  • Main IPC: H03K17/00
  • IPC: H03K17/00
Pulse edge selection circuit, and pulse generation circuit, sample-hold circuit, and solid-state image sensor using the same
Abstract:
A pulse edge selection circuit includes an input stage which selects and passes one clock from among a plurality of clocks and an output stage which outputs the clock to an edge detection circuit. The output stage has a combination of a plurality of NOR gates and a plurality of NAND gates, which are connected alternately, both the NOR gates and NAND gates having a plurality of input terminals. If the edge detection circuit is a type which detects falling edges of clocks and generates a pulse which rises on the falling edge of a first clock and falls on the falling edge of a second clock, a NOR gate is used as an output gate which outputs the first clock and the second clock. On the other hand, if a pulse is generated on rising edges, a NAND gate is used as an output gate.
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