Invention Grant
US08368439B2 Phase locked loop circuit, method of detecting lock, and system having the circuit
有权
锁相环电路,检测锁的方法和具有电路的系统
- Patent Title: Phase locked loop circuit, method of detecting lock, and system having the circuit
- Patent Title (中): 锁相环电路,检测锁的方法和具有电路的系统
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Application No.: US13049474Application Date: 2011-03-16
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Publication No.: US08368439B2Publication Date: 2013-02-05
- Inventor: Tae-Kwang Jang , Jae-Jin Park , Ji-Hyun Kim
- Applicant: Tae-Kwang Jang , Jae-Jin Park , Ji-Hyun Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2010-0024402 20100318
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Provided are a phase locked loop (PLL) circuit, a lock detector employable with a PLL circuit, a system including such a PLL circuit and/or lock detector, and a method of detecting a lock/unlock state of a PLL circuit. The PLL circuit may include a clock generating circuit configured to generate an output clock signal having a predetermined frequency in synchronization with a reference clock signal. The lock detector may be configured to determine that the PLL circuit is in a lock state when a phase difference between the reference clock signal and the output clock signal is equal to or less than a first reference value, determine that the PLL circuit is in an unlock state when the phase difference between the reference clock signal and the output clock signal is greater than a second reference value, and generate a lock detection signal.
Public/Granted literature
- US20110227616A1 PHASE LOCKED LOOP CIRCUIT, METHOD OF DETECTING LOCK, AND SYSTEM HAVING THE CIRCUIT Public/Granted day:2011-09-22
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