Invention Grant
- Patent Title: Article inspection apparatus
- Patent Title (中): 物品检验仪器
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Application No.: US11645082Application Date: 2006-12-22
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Publication No.: US08368749B2Publication Date: 2013-02-05
- Inventor: Thomas Eldred Lambdin , Bradford Morse , Clark A. Bendall , Edward B. Hubben , Thomas W. Karpen , Bruce A. Pellegrino
- Applicant: Thomas Eldred Lambdin , Bradford Morse , Clark A. Bendall , Edward B. Hubben , Thomas W. Karpen , Bruce A. Pellegrino
- Applicant Address: US NY Schenectady
- Assignee: GE Inspection Technologies LP
- Current Assignee: GE Inspection Technologies LP
- Current Assignee Address: US NY Schenectady
- Agency: Global Patent Operation
- Agent Catherine J. Toppin
- Main IPC: H04N7/18
- IPC: H04N7/18
Abstract:
An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.
Public/Granted literature
- US20070226258A1 Article inspection apparatus Public/Granted day:2007-09-27
Information query
