Invention Grant
US08368750B2 Non-uniformity evaluation apparatus, non-uniformity evaluation method, and display inspection apparatus and program
失效
不均匀性评价装置,不均匀性评价方法以及显示检查装置和程序
- Patent Title: Non-uniformity evaluation apparatus, non-uniformity evaluation method, and display inspection apparatus and program
- Patent Title (中): 不均匀性评价装置,不均匀性评价方法以及显示检查装置和程序
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Application No.: US12643017Application Date: 2009-12-21
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Publication No.: US08368750B2Publication Date: 2013-02-05
- Inventor: Yumi Mori , Hiroki Nakano
- Applicant: Yumi Mori , Hiroki Nakano
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Michael J. LeStrange
- Priority: JP2008-328140 20081224
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N9/47

Abstract:
A mura evaluation apparatus 100 includes: a mura detection unit 110 that acquires multiple images of a display mura present in a display area of a display device by scanning the display area while moving along a spherical surface with a preset radius; and an information processing apparatus 150 that generates a three-dimensional mura figure from the multiple images acquired by the mura detection unit, by associating a feature value of the display mura in each of the images with a position where the image is acquired, and generates a mura superimposed image in which the three-dimensional mura figure viewed from a designated observation angle is superimposed.
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