Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US11629987Application Date: 2005-06-21
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Publication No.: US08368870B2Publication Date: 2013-02-05
- Inventor: Makoto Shibuta
- Applicant: Makoto Shibuta
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2004-182678 20040621
- International Application: PCT/JP2005/011375 WO 20050621
- International Announcement: WO2005/124835 WO 20051229
- Main IPC: G03B27/58
- IPC: G03B27/58 ; G03B27/52

Abstract:
An exposure apparatus that can prevent disadvantages due to a leaked liquid is provided. The exposure apparatus includes: a substrate holder (PH) that includes a peripheral wall portion (33) and supporting portions (34) located on an inside of the peripheral wall portion (33) and that supports a substrate (P) with the supporting portions (34) by negatively pressurizing a space (31) surrounded by the peripheral wall portion (33); and a recovery mechanism that includes a collection inlets (61) provided on the inside of the peripheral wall portion (33) and a vacuum system (63) connected to the collection inlets (61), in which a liquid penetrated from an outer periphery of the substrate (P) is sucked and recovered, in the state with an upper surface (33A) of the peripheral wall portion (33) and a back surface (Pb) of the substrate (P) being spaced at a first distance.
Public/Granted literature
- US20080043210A1 Exposure Apparatus and Device Manufacturing Method Public/Granted day:2008-02-21
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