Invention Grant
- Patent Title: Early detection of degradation in NOR flash memory
- Patent Title (中): 早期检测NOR闪存中的降解
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Application No.: US12930019Application Date: 2010-12-22
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Publication No.: US08369143B2Publication Date: 2013-02-05
- Inventor: Luiz M. Franca-Neto , Richard Leo Galbraith , Travis Roger Oenning
- Applicant: Luiz M. Franca-Neto , Richard Leo Galbraith , Travis Roger Oenning
- Applicant Address: NL Amsterdam
- Assignee: HGST Netherlands B.V.
- Current Assignee: HGST Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agent G. Marlin Knight
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
The embodiments of the invention in this disclosure describe techniques for early warning of degradation in NOR Flash memories by estimating the dispersion of the threshold voltages (VT's), of a set of NOR Flash memory cells during read operations. In an embodiment invention the time-to-completion (TTC) values for the read operation for the memory cells are used as a proxy for dispersion of the threshold voltages (VT's). If the measured TTC dispersion differs by more than a selected amount from the reference dispersion value, a warning signal is provided to indicate that the page of memory has degraded significantly. Higher level components in the system can use the warning signal to take appropriate action. Since every cell's VT position in an ideal distribution can be estimated, the data from each cell can have a confidence level assigned based on deviation from the mean of an ideal distribution.
Public/Granted literature
- US20120163073A1 Early detection of degradation in NOR flash memory Public/Granted day:2012-06-28
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