Invention Grant
US08369161B2 Semiconductor device and control method therefor 有权
半导体装置及其控制方法

  • Patent Title: Semiconductor device and control method therefor
  • Patent Title (中): 半导体装置及其控制方法
  • Application No.: US13026075
    Application Date: 2011-02-11
  • Publication No.: US08369161B2
    Publication Date: 2013-02-05
  • Inventor: Yukio Hayakawa
  • Applicant: Yukio Hayakawa
  • Applicant Address: US CA Sunnyvale
  • Assignee: Spansion LLC
  • Current Assignee: Spansion LLC
  • Current Assignee Address: US CA Sunnyvale
  • Main IPC: G11C16/02
  • IPC: G11C16/02
Semiconductor device and control method therefor
Abstract:
A semiconductor device includes an insulation layer (14) provided on a semiconductor substrate (12), a p-type semiconductor region (16) provided on the insulation layer, an isolation region (18) provided that surrounds the p-type semiconductor region to reach the insulation layer, an n-type source region (20) and an n-type drain region (22) provided on the p-type semiconductor region, a charge storage region (30) provided above the p-type semiconductor region between the n-type source region and the n-type drain region, and an voltage applying portion that applies a different voltage to the p-type semiconductor region while any of programming, erasing and reading a different data of a memory cell that has the charge storage region is being preformed.
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