Invention Grant
- Patent Title: Semiconductor device and control method therefor
- Patent Title (中): 半导体装置及其控制方法
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Application No.: US13026075Application Date: 2011-02-11
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Publication No.: US08369161B2Publication Date: 2013-02-05
- Inventor: Yukio Hayakawa
- Applicant: Yukio Hayakawa
- Applicant Address: US CA Sunnyvale
- Assignee: Spansion LLC
- Current Assignee: Spansion LLC
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G11C16/02
- IPC: G11C16/02

Abstract:
A semiconductor device includes an insulation layer (14) provided on a semiconductor substrate (12), a p-type semiconductor region (16) provided on the insulation layer, an isolation region (18) provided that surrounds the p-type semiconductor region to reach the insulation layer, an n-type source region (20) and an n-type drain region (22) provided on the p-type semiconductor region, a charge storage region (30) provided above the p-type semiconductor region between the n-type source region and the n-type drain region, and an voltage applying portion that applies a different voltage to the p-type semiconductor region while any of programming, erasing and reading a different data of a memory cell that has the charge storage region is being preformed.
Public/Granted literature
- US20110141807A1 SEMICONDUCTOR DEVICE AND CONTROL METHOD THEREFOR Public/Granted day:2011-06-16
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