Invention Grant
US08369173B2 Semiconductor devices and methods for changing operating characteristics and semiconductor systems including the same 有权
用于改变工作特性的半导体器件和方法以及包括其的半导体系统

Semiconductor devices and methods for changing operating characteristics and semiconductor systems including the same
Abstract:
A method of changing a parameter in a semiconductor device is provided. The method includes receiving and storing data in a storage region; and changing at least one between a DC characteristic and an AC timing characteristic of a parameter, used to access a non-volatile memory cell included in a memory core of the semiconductor device, according to the data stored in the storage.
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