Invention Grant
US08369177B2 Techniques for reading from and/or writing to a semiconductor memory device
有权
从半导体存储器件读取和/或写入的技术
- Patent Title: Techniques for reading from and/or writing to a semiconductor memory device
- Patent Title (中): 从半导体存储器件读取和/或写入的技术
-
Application No.: US12718310Application Date: 2010-03-05
-
Publication No.: US08369177B2Publication Date: 2013-02-05
- Inventor: Betina Hold , Robert Murray
- Applicant: Betina Hold , Robert Murray
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
Techniques for reading from and/or writing to a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus including a first memory cell array having a first plurality of memory cells arranged in a matrix of rows and columns and a second memory cell array having a second plurality of memory cells arranged in a matrix of row and columns. The apparatus may also include a data sense amplifier latch circuitry having a first input node and a second input node. The apparatus may further include a first bit line input circuitry configured to couple the first memory cell array to the first input node of the data sense amplifier latch circuitry and a second bit line input circuitry configured to couple the second memory cell array to the second input node of the data sense amplifier latch circuitry.
Public/Granted literature
- US20110216608A1 TECHNIQUES FOR READING FROM AND/OR WRITING TO A SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2011-09-08
Information query