Invention Grant
- Patent Title: X-ray inspection device
- Patent Title (中): X光检查装置
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Application No.: US12791478Application Date: 2010-06-01
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Publication No.: US08369481B2Publication Date: 2013-02-05
- Inventor: Masahiro Shimada
- Applicant: Masahiro Shimada
- Applicant Address: JP Kyoto
- Assignee: Ishida Co., Ltd.
- Current Assignee: Ishida Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2009-137207 20090608
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
An X-ray inspection device includes an X-ray detecting unit, a determining unit, and an output unit. The X-ray detecting unit is configured and arranged to detect a level of X-rays passing through an article. The determining unit is configured to determine a state of the article based on a detection level of the X-rays detected by the X-ray detecting unit using a plurality of thresholds including a first threshold and a second threshold for a single determination criterion. The output unit is configured and arranged to output a result of determination made by the determining unit.
Public/Granted literature
- US20100310043A1 X-RAY INSPECTION DEVICE Public/Granted day:2010-12-09
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