Invention Grant
US08369481B2 X-ray inspection device 有权
X光检查装置

X-ray inspection device
Abstract:
An X-ray inspection device includes an X-ray detecting unit, a determining unit, and an output unit. The X-ray detecting unit is configured and arranged to detect a level of X-rays passing through an article. The determining unit is configured to determine a state of the article based on a detection level of the X-rays detected by the X-ray detecting unit using a plurality of thresholds including a first threshold and a second threshold for a single determination criterion. The output unit is configured and arranged to output a result of determination made by the determining unit.
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