Invention Grant
- Patent Title: High definition impedance imaging
- Patent Title (中): 高清晰度阻抗成像
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Application No.: US12375145Application Date: 2007-07-27
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Publication No.: US08369941B2Publication Date: 2013-02-05
- Inventor: Alvin Wexler , Patrick Adrian O'Connor , Rajen Manicon Murugan , Zhong Zheng
- Applicant: Alvin Wexler , Rajen Manicon Murugan , Zhong Zheng , Misty O'Connor
- Agency: Oppedahl Patent Law Firm LLC
- Priority: CA2554321 20060727
- International Application: PCT/CA2007/001327 WO 20070727
- International Announcement: WO2008/011716 WO 20080131
- Main IPC: A61B5/05
- IPC: A61B5/05

Abstract:
A method for producing a computationally efficient system that reduces the number of iterations required to generate a conductivity image pattern of a subsurface object, and its attendant conductivity distribution, through a solution to the system of field equations that simultaneously satisfies all of the boundary conditions and conserves internal current flux densities.
Public/Granted literature
- US20100290675A1 HIGH DEFINITION IMPEDANCE IMAGING Public/Granted day:2010-11-18
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